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Preface to Special Topic: Defects in Semiconductors
Author(s) -
F. Tuomisto,
Ilja Makkonen
Publication year - 2016
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4948578
Subject(s) - semiconductor , materials science , engineering physics , computer science , physics , optoelectronics
Powered by TCPDF (www.tcpdf.org) This material is protected by copyright and other intellectual property rights, and duplication or sale of all or part of any of the repository collections is not permitted, except that material may be duplicated by you for your research use or educational purposes in electronic or print form. You must obtain permission for any other use. Electronic or print copies may not be offered, whether for sale or otherwise to anyone who is not an authorised user. Tuomisto, Filip; Makkonen, Ilja

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