Open AccessDielectric constant extraction of graphene nanostructured on SiC substrates from spectroscopy ellipsometry measurement using Gauss–Newton inversion method
Author(s) -
Hervin Maulina,
Iman Santoso,
Emmistasega Subama,
Pekik Nurwantoro,
Kamsul Abraha,
Andrivo Rusydi
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4945500
Subject(s) - graphene , ellipsometry , dielectric , materials science , refractive index , permittivity , spectroscopy , condensed matter physics , physics , optoelectronics , thin film , nanotechnology , quantum mechanics
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