Spin-polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline NiFe film with a fine magnetic tip sensitive to a well-defined magnetization component | Zendy

H. Matsuyama | Zendy; D. Nara | Zendy; R. Kageyama | Zendy; K. Honda | Zendy; T. Sato | Zendy; K. Kusanagi | Zendy; E. Srinivasan | Zendy; K. Koike | Zendy

Open Access

Spin-polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline NiFe film with a fine magnetic tip sensitive to a well-defined magnetization component

Author(s) -

H. Matsuyama,

D. Nara,

R. Kageyama,

K. Honda,

T. Sato,

K. Kusanagi,

E. Srinivasan,

K. Koike

Publication year - 2016

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.4944951

Subject(s) - magnetization , condensed matter physics , scanning tunneling microscope , materials science , magnetic force microscope , spin polarized scanning tunneling microscopy , crystallite , spin (aerodynamics) , magnetic field , scanning tunneling spectroscopy , physics , quantum mechanics , metallurgy , thermodynamics

We developed a micrometer-sized magnetic tip integrated onto the write head of a hard disk drive for spin-polarized scanning tunneling microscopy (SP-STM) in the modulated tip magnetization mode. Using SP-STM, we measured a well-defined in-plane spin-component of the tunneling current of the rough surface of a polycrystalline NiFe film. The spin asymmetry of the NiFe film was about 1.3% within the bias voltage range of -3 to 1 V. We obtained the local spin component image of the sample surface, switching the magnetic field of the sample to reverse the sample magnetization during scanning. We also obtained a spin image of the rough surface of a polycrystalline NiFe film evaporated on the recording medium of a hard disk drive

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