Effect of additional elements on compositional modulated atomic layered structure of hexagonal Co80Pt20 alloy films with superlattice diffraction | Zendy

Shintaro Hinata | Zendy; Akira Yamane | Zendy; Shin Saito | Zendy

Open Access

Effect of additional elements on compositional modulated atomic layered structure of hexagonal Co80Pt20 alloy films with superlattice diffraction

Author(s) -

Shintaro Hinata,

Akira Yamane,

Shin Saito

Publication year - 2016

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.4944668

Subject(s) - stacking , superlattice , alloy , materials science , diffraction , crystallography , hexagonal crystal system , layer (electronics) , x ray crystallography , nanotechnology , composite material , optoelectronics , chemistry , optics , physics , organic chemistry

The effect of additional element on compositionally modulated atomic layered structure of hexagonal Co80Pt20 alloy films with superlattice diffraction was investigated. In this study it is found that the addition of Cr or W element to Co80Pt20 alloy film shows less deterioration of hcp stacking structure and compositionally modulated atomic layer stacking structure as compared to Si or Zr or Ti with Ku of around 1.4 or 1.0 × 107 erg/cm3 at 5 at.% addition. Furthermore, for O2 addition of O2 ≥ 5.0 × 10−3 Pa to CoPt alloy, compositionally modulated atomic layer stacking structure will be deteriorated with enhancement of formation of hcp stacking structure which leads higher Ku of 1.0 × 107 erg/cm3

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