Spatial resolution and switching field of magnetic force microscope tips prepared by coating Fe/Co-Pt layers | Zendy

Ryo Nagatsu | Zendy; Mitsuru Ohtake | Zendy; Masaaki Futamoto | Zendy; Fumiyoshi Kirino | Zendy; Nobuyuki Inaba | Zendy

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Spatial resolution and switching field of magnetic force microscope tips prepared by coating Fe/Co-Pt layers

Author(s) -

Ryo Nagatsu,

Mitsuru Ohtake,

Masaaki Futamoto,

Fumiyoshi Kirino,

Nobuyuki Inaba

Publication year - 2016

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.4944397

Subject(s) - materials science , magnetic force microscope , coating , layer (electronics) , stacking , dual layer , alloy , deposition (geology) , magnetic field , microscope , radius , resolution (logic) , patterned media , analytical chemistry (journal) , composite material , optics , magnetization , nuclear magnetic resonance , chemistry , grain size , paleontology , physics , computer security , quantum mechanics , artificial intelligence , sediment , computer science , biology , chromatography

Magnetic force microscope tips are prepared by coating Si tips of 4 nm radius with magnetic bi-layer film consisting of soft magnetic material of Fe(x nm) and hard magnetic material Co-Pt alloy (20–x nm), 0 ≤ x ≤ 20. The effects of layer thickness ratio and stacking sequence on the spatial resolution and the switching field are investigated. Higher resolutions are observed for tips prepared by coating Co-Pt alloy followed by Fe film deposition compared with those prepared by employing the opposite deposition sequence. The resolution improves from 11.0 to 8.2 nm whereas the switching field decreases from 1525 to 475 Oe with increasing the x value from 0 to 20 nm. The present study has shown a possibility of tuning MFM tip performance by employing a soft/hard dual layer structure

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