Signature of structural distortion in optical spectra of YFe2O4 thin film | Zendy

Ram Rai | Zendy; J. Hinz | Zendy; G. X. A. Petronilo | Zendy; Fei Sun | Zendy; Hao Zeng | Zendy; M. L. Nakarmi | Zendy; Pradip Niraula | Zendy

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Signature of structural distortion in optical spectra of YFe2O4 thin film

Author(s) -

Ram Rai,

J. Hinz,

G. X. A. Petronilo,

Fei Sun,

Hao Zeng,

M. L. Nakarmi,

Pradip Niraula

Publication year - 2016

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.4942753

Subject(s) - thin film , distortion (music) , sapphire , materials science , crystallite , spectral line , electric field , analytical chemistry (journal) , charge (physics) , molecular physics , atomic physics , optics , chemistry , optoelectronics , laser , physics , nanotechnology , amplifier , cmos , chromatography , quantum mechanics , astronomy , metallurgy

We report structural, optical, and electro-optical properties of polycrystalline YFe2O4 thin films, deposited on (0001) sapphire substrates using the electron-beam deposition technique. The optical spectra of a 120 nm YFe2O4 show Fe d to d on-site and O 2p to Fe 3d, Y 4d, and Y 5s charge-transfer electronic excitations. Anomalies in the temperature dependence data of the charge-transfer excitations and the splitting of the 4.46 eV charge-transfer peak strongly suggest a structural distortion at 180 ± 10 K. Evidence of such a structural distortion is also manifested in the surface resistance versus temperature data. In addition, the YFe2O4 thin film at low temperatures shows strong electro-optical properties, as high as 9% in the energy range of 1 - 2.5 eV, for applied electric fields up to 500 V.cm−1

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