Second and third harmonic generation in few-layer gallium telluride characterized by multiphoton microscopy
Author(s) -
Jannatul Susoma,
Lasse Karvonen,
Antti Säynätjoki,
Soroush Mehravar,
Robert A. Norwood,
N. Peyghambarian,
Khanh Kieu,
Harri Lipsanen,
Juha Riikonen
Publication year - 2016
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4941998
Subject(s) - second harmonic generation , telluride , gallium arsenide , materials science , nonlinear optics , layer (electronics) , microscopy , laser , optoelectronics , wavelength , high harmonic generation , optical microscope , surface second harmonic generation , gallium , optics , scanning electron microscope , nanotechnology , physics , metallurgy , composite material
We report on the nonlinear optical properties of few-layer GaTe studied by multiphoton microscopy. Second and third harmonic generation from few-layer GaTe flakes were observed in this study with the laser pump wavelength of 1560 nm. These processes were found to be sensitive to the number of GaTe layers. The second- and third-order nonlinear susceptibilities of 2.7 × 10-9 esu (1.15 pm/V) and 1.4 × 10-8 esu (2 × 10-16 m2/V2) were estimated, respectively.Peer reviewe
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