Characterization of atomic force microscopy written conducting nanowires at LaAlO3/SrTiO3 interfaces | Zendy

Margherita Boselli | Zendy; Danfeng Li | Zendy; Wei Liu | Zendy; A. Fête | Zendy; Stefano Gariglio | Zendy; J.M. Triscone | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Characterization of atomic force microscopy written conducting nanowires at LaAlO3/SrTiO3 interfaces

Author(s) -

Margherita Boselli,

Danfeng Li,

Wei Liu,

A. Fête,

Stefano Gariglio,

J.M. Triscone

Publication year - 2016

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.4941817

Subject(s) - nanowire , realization (probability) , characterization (materials science) , nanostructure , atomic force microscopy , materials science , kelvin probe force microscope , nanotechnology , conductive atomic force microscopy , microscopy , optoelectronics , condensed matter physics , physics , optics , statistics , mathematics

The realization of conducting nanostructures at the interface between LaAlO3 and SrTiO3 is an important step towards the realization of devices and the investigation of exotic physical regimes. We present here a detailed study of the conducting nanowires realized using the atomic force microscopy writing technique. By comparing experiments with numerical simulations, we show that these wires reproduce the ideal case of nanoconducting channels defined in an insulating background very well and that the tip bias is a powerful knob to modulate the size of these structures. We also discuss the role of the air humidity that is found to be a crucial parameter to set the size of the tip-sample effective interaction area

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research