Open AccessOverview of the program to assess the reliability of emerging nondestructive techniques open testing and study of flaw type effect on NDE response
Author(s) -
Ryan M. Meyer,
Ichirō Kōmura,
Kyung-cho Kim,
Tommy Zetterwall,
Stephen E. Cumblidge,
Iouri Prokofiev
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4940654
Subject(s) - nondestructive testing , reliability (semiconductor) , reliability engineering , engineering , computer science , forensic engineering , medicine , power (physics) , physics , quantum mechanics , radiology
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