Root-cause estimation of ultrasonic scattering signatures within a complex textured titanium
Author(s) -
James L. Blackshire,
Jeong K. Na,
Shaun L. Freed
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4940525
Subject(s) - nondestructive testing , materials science , microstructure , ultrasonic sensor , titanium alloy , aerospace , scattering , computer science , characterization (materials science) , aerospace materials , mechanical engineering , acoustics , aerospace engineering , optics , engineering , composite material , nanotechnology , physics , alloy , quantum mechanics
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