Finite element modelling of wave propagation in highly scattering materials | Zendy

Anton Van Pamel | Zendy; Peter Huthwaite | Zendy; Colin Brett | Zendy; M. J. S. Lowe | Zendy

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Finite element modelling of wave propagation in highly scattering materials

Author(s) -

Anton Van Pamel,

Peter Huthwaite,

Colin Brett,

M. J. S. Lowe

Publication year - 2016

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.4940519

Subject(s) - scattering , finite element method , acoustics , backscatter (email) , common emitter , range (aeronautics) , sampling (signal processing) , optics , computer science , materials science , computational physics , electronic engineering , physics , engineering , telecommunications , structural engineering , composite material , detector , wireless

Ultrasonic inspection of highly scattering materials presents challenges for industry. This article describes a Finite Element modelling methodology to simulate wave propagation within polycrystalline materials. Concerns are answered regarding its required mesh sampling and ability to capture the complex scattering physics. It is shown that grain scattering phenomena are closely reproduced across a range of scattering regimes. The procedure is subsequently applied to investigate the optimal configuration of an array inspecting such a material. It is found that in certain situations, separating emitter and receiver can be advantageous as this reduces the received backscatter.

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