Open AccessElectrostatic properties of two-dimensional WSe2 nanostructures
Author(s) -
Guolin Hao,
Liangzhi Kou,
Donglin Lu,
Jie Peng,
Jin Li,
Chao Tang,
Jianxin Zhong
Publication year - 2016
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4940160
Subject(s) - kelvin probe force microscope , nanostructure , nanotechnology , atomic force microscopy , materials science , electrostatics , electrostatic force microscope , microscopy , nanoscopic scale , photoconductive atomic force microscopy , transition metal , optoelectronics , chemistry , scanning electron microscope , catalysis , optics , physics , scanning capacitance microscopy , scanning confocal electron microscopy , composite material , biochemistry
Recently, two-dimensional transition metal dichalcogenides have intrigued much attention due to their promising applications in optoelectronics. The electrostatic property investigation of WSe2 nanostructures is essential for device application. Here, the interlayer screening effects of WSe2 nanoplates with different thicknesses were investigated by measuring surface potential employing Kelvin probe force microscopy. Simultaneously, charges can be injected into WSe2 nanoplate by means of conducting atomic force microscopy to tune the electrostatic properties of WSe2 nanostructures. Our experimental results have some important implications for improving performance of WSe2-based optoelectronic devices through interface or surface engineering. © 2016 AIP Publishing LLC
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