Open AccessAngle resolved x-ray photoelectron spectroscopy (ARXPS) analysis of lanthanum oxide for micro-flexography printing
Author(s) -
Suhaimi Hassan,
Mohd Sallehuddin Yusof,
Zaidi Embong,
M.I. Maksud
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4940088
Subject(s) - x ray photoelectron spectroscopy , lanthanum , materials science , substrate (aquarium) , wafer , oxide , lanthanum oxide , nanotechnology , analytical chemistry (journal) , chemical engineering , chemistry , inorganic chemistry , metallurgy , oceanography , chromatography , engineering , geology
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