z-logo
open-access-imgOpen Access
Exchange bias in epitaxial and polycrystalline thin film Ru2MnGe/Fe bilayers
Author(s) -
Jan Balluff,
Markus Meinert,
J. Schmalhorst,
Günter Reiss,
Elke Arenholz
Publication year - 2015
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4939092
Subject(s) - exchange bias , crystallite , antiferromagnetism , epitaxy , condensed matter physics , thin film , materials science , field (mathematics) , magnetic field , layer (electronics) , magnetization , nanotechnology , magnetic anisotropy , metallurgy , physics , quantum mechanics , mathematics , pure mathematics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom