A tutorial introduction to DCM quantitative characterization and modelling of material microstructures using monochromatic multi-energy x-ray CT | Zendy

Sam Yang | Zendy; Adrian Trinchi | Zendy; Andrew Tulloh | Zendy; Clement Chu | Zendy

Open Access

A tutorial introduction to DCM quantitative characterization and modelling of material microstructures using monochromatic multi-energy x-ray CT

Author(s) -

Sam Yang,

Adrian Trinchi,

Andrew Tulloh,

Clement Chu

Publication year - 2016

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.4937523

Subject(s) - characterization (materials science) , monochromatic color , computer science , microstructure , software , set (abstract data type) , energy (signal processing) , materials science , computational science , optics , physics , nanotechnology , composite material , programming language , quantum mechanics

This article is intended as a tutorial guide for new users of the DCM (data-constrained modelling) software for quantitative characterization of material 3D microstructures using multi-energy X-ray CT data. It guides users through the steps necessary for processing a small CIPS (Calcite In-situ Precipitation System) sandstone data set. It also covers some built-in and plug-in features to analyze and visualize the microstructures.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research