Laboratory source based full-field x-ray microscopy at 9 keV
Author(s) -
Christian Fella,
Andreas Balles,
Wolfram Wiest,
Simon Zabler,
Randolf Hanke
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4937519
Subject(s) - condenser (optics) , scintillator , microscope , tungsten , optical microscope , optics , microscopy , materials science , transmission electron microscopy , x ray , anode , field ion microscope , optoelectronics , physics , detector , light source , scanning electron microscope , metallurgy , electrode , ion , quantum mechanics
In the past decade, hard x-ray transmission microscopy experienced tremendous developments. With the availability of efficient Fresnel zone plates, even set-ups utilizing laboratory sources were developed [1]. In order to improve the performance of these x-ray microscopes, novel approaches to fabricate optical elements [2] and brighter x-ray tubes [3] are promising candidates. We are currently building a laboratory transmission x-ray microscope for 9.25 keV, using an electron impact liquid-metal-jet anode source. Up to now, the further elements of our setup are: a polycapillary condenser, a tungsten zone plate, and a scintillator which is optically coupled to a CMOS camera. However, further variations in terms of optical elements are intended. Here we present the current status of our work, as well as first experimental results
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