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Differential phase contrast in scanning x-ray microscopy with half-wavelength phase shifter
Author(s) -
Yoshio Suzuki,
Akihisa Takeuchi
Publication year - 2016
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4937508
Subject(s) - optics , diaphragm (acoustics) , microscopy , differential interference contrast microscopy , phase (matter) , materials science , x ray optics , aperture (computer memory) , optical microscope , fresnel zone , phase contrast imaging , beam (structure) , diffraction , zone plate , physics , phase contrast microscopy , x ray , scanning electron microscope , quantum mechanics , acoustics , loudspeaker

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