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Identification of an organic semiconductor superlattice structure of pentacene and perfluoro-pentacene through resonant and non-resonant X-ray scattering
Author(s) -
Stefan Kowarik,
Alexander Hinderhofer,
C. Wang,
C. Weber,
Alexander Gerlach,
Alexander Hexemer,
Stefano Leone,
Frank Schreiber
Publication year - 2015
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4936884
Subject(s) - pentacene , superlattice , organic semiconductor , stacking , materials science , semiconductor , monolayer , scattering , optoelectronics , condensed matter physics , optics , chemistry , nanotechnology , physics , layer (electronics) , organic chemistry , thin film transistor
Highly crystalline and stable molecular superlattices are grown with the smallest possible stacking period using monolayers (MLs) of the organic semiconductors pentacene (PEN) and perfluoro-pentacene (PFP). Superlattice reflections in X-ray reflectivity and their energy dependence in resonant soft X-ray reflectivity measurements show that PFP and PEN MLs indeed alternate even though the coherent ordering is lost after ∼ 4 ML. The observed lattice spacing of 15.9 Å in the superlattice is larger than in pure PEN and PFP films, presumably because of more upright standing molecules and lack of interdigitation between the incommensurate crystalline PEN and PFP layers. The findings are important for the development of novel organic quantum optoelectronic devices

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