Open AccessPolarization-dependent differential reflectance spectroscopy for real-time monitoring of organic thin film growth
Author(s) -
A. NavarroQuezada,
M. Aiglinger,
Ebrahim Ghanbari,
Thorsten Wagner,
P. Zeppenfeld
Publication year - 2015
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4936352
Subject(s) - thin film , spectroscopy , anisotropy , polarization (electrochemistry) , reflectivity , materials science , diffuse reflectance infrared fourier transform , deposition (geology) , optics , optoelectronics , analytical chemistry (journal) , chemistry , nanotechnology , physics , paleontology , biochemistry , chromatography , quantum mechanics , photocatalysis , sediment , biology , catalysis
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