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A laboratory based edge-illumination x-ray phase-contrast imaging setup with two-directional sensitivity
Author(s) -
Gibril K. Kallon,
Michal J. Wesolowski,
Fabio A. Vittoria,
Marco Endrizzi,
Dario Basta,
Thomas P. Millard,
Paul C. Diémoz,
Alessandro Olivo
Publication year - 2015
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4935983
Subject(s) - sensitivity (control systems) , phase (matter) , optics , phase contrast imaging , x ray phase contrast imaging , streak , contrast (vision) , differential phase , phase retrieval , phase contrast microscopy , physics , differential (mechanical device) , computer science , fourier transform , electronic engineering , thermodynamics , quantum mechanics , engineering
We report on a preliminary laboratory based x-ray phase-contrast imaging system capable of achieving two-directional phase sensitivity, thanks to the use of L-shaped apertures. We show that in addition to apparent absorption, two-directional differential phase images of an object can be quantitatively retrieved by using only three input images. We also verify that knowledge of the phase derivatives along both directions allows for straightforward phase integration with no streak artefacts, a known problem common to all differential phase techniques. In addition, an analytical method for 2-directional dark field retrieval is proposed and experimentally demonstrated.

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