Comparison between laser terahertz emission microscope and conventional methods for analysis of polycrystalline silicon solar cell | Zendy

H. Nakanishi | Zendy; Akira Ito | Zendy; Kazuhisa Takayama | Zendy; Iwao Kawayama | Zendy; Hironaru Murakami | Zendy; Masayoshi Tonouchi | Zendy

Open Access

Comparison between laser terahertz emission microscope and conventional methods for analysis of polycrystalline silicon solar cell

Author(s) -

H. Nakanishi,

Akira Ito,

Kazuhisa Takayama,

Iwao Kawayama,

Hironaru Murakami,

Masayoshi Tonouchi

Publication year - 2015

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.4935913

Subject(s) - materials science , terahertz radiation , laser , optoelectronics , polycrystalline silicon , microscope , electroluminescence , solar cell , photoluminescence , crystallite , optics , microscopy , layer (electronics) , nanotechnology , physics , metallurgy , thin film transistor

A laser terahertz emission microscope (LTEM) can be used for noncontact inspection to detect the waveforms of photoinduced terahertz emissions from material devices. In this study, we experimentally compared the performance of LTEM with conventional analysis methods, e.g., electroluminescence (EL), photoluminescence (PL), and laser beam induced current (LBIC), as an inspection method for solar cells. The results showed that LTEM was more sensitive to the characteristics of the depletion layer of the polycrystalline solar cell compared with EL, PL, and LBIC and that it could be used as a complementary tool to the conventional analysis methods for a solar cell

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