Open AccessDose rate effects on array CCDs exposed by Co-60 γ rays induce saturation output degradation and annealing tests
Author(s) -
Zujun Wang,
Wei Chen,
Baoping He,
Zhibin Yao,
Z. G. Xiao,
Jiangkun Sheng,
Minbo Liu
Publication year - 2015
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4934931
Subject(s) - annealing (glass) , dose rate , radiation , degradation (telecommunications) , irradiation , saturation (graph theory) , dose dependence , analytical chemistry (journal) , materials science , chemistry , radiochemistry , nuclear medicine , optics , physics , electronic engineering , medicine , nuclear physics , chromatography , composite material , mathematics , combinatorics , engineering
The experimental tests of dose rate and annealing effects on array charge-coupled devices (CCDs) are presented. The saturation output voltage (VS) versus the total dose at the dose rates of 0.01, 0.1, 1.0, 10.0 and 50 rad(Si)/s are compared. Annealing tests are performed to eliminate the time-dependent effects. The VS degradation levels depend on the dose rates. The VS degradation mechanism induced by dose rate and annealing effects is analyzed. The VS at 20 krad(Si) with the dose rate of 0.03 rad(Si)/s are supplemented to assure the degradation curves between the dose rates of 0.1 and 0.01 rad(Si)/s. The CCDs are divided into two groups, with one group biased and the other unbiased during 60Co γ radiation. The VS degradation levels of the biased CCDs during radiation are more severe than that of the unbiased CCDs
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