Three-dimensional multimodal imaging and analysis of biphasic microstructure in a Ti–Ni–Sn thermoelectric material | Zendy

Jason E. Douglas | Zendy; McLean P. Echlin | Zendy; William C. Lenthe | Zendy; Ram Seshadri | Zendy; Tresa M. Pollock | Zendy

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Three-dimensional multimodal imaging and analysis of biphasic microstructure in a Ti–Ni–Sn thermoelectric material

Author(s) -

Jason E. Douglas,

McLean P. Echlin,

William C. Lenthe,

Ram Seshadri,

Tresa M. Pollock

Publication year - 2015

Publication title -

apl materials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.571

H-Index - 60

ISSN - 2166-532X

DOI - 10.1063/1.4931764

Subject(s) - materials science , microstructure , electron backscatter diffraction , scanning electron microscope , thermoelectric effect , femtosecond , spectroscopy , diffraction , laser , analytical chemistry (journal) , crystallography , optics , composite material , thermodynamics , physics , quantum mechanics , chemistry , chromatography

The three-dimensional microstructure of levitation melted TiNi1.20Sn has been characterized using the TriBeam system, a scanning electron microscope equipped with a femtosecond laser for rapid serial sectioning, to map the character of interfaces. By incorporating both chemical data (energy dispersive x-ray spectroscopy) and crystallographic data (electron backscatter diffraction), the grain structure and phase morphology were analyzed in a 155 μm × 178 μm × 210 μm volume and were seen to be decoupled. The predominant phases present in the material, half-Heusler TiNiSn, and full-Heusler TiNi2Sn have a percolated structure. The distribution of coherent interfaces and high-angle interfaces has been measured quantitatively

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