Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy | Zendy

Zdravko Siketić | Zendy; Iva Bogdanović Radović | Zendy; M. Jakšić | Zendy; Marijana Popović Hadžija | Zendy; Mirko Hadžija | Zendy

Open Access

Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy

Author(s) -

Zdravko Siketić,

Iva Bogdanović Radović,

M. Jakšić,

Marijana Popović Hadžija,

Mirko Hadžija

Publication year - 2015

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.4930062

Subject(s) - secondary ion mass spectrometry , mass spectrometry , ion , time of flight , mass spectrometry imaging , analytical chemistry (journal) , static secondary ion mass spectrometry , chemistry , time of flight mass spectrometry , transmission electron microscopy , materials science , nanotechnology , ionization , organic chemistry , chromatography

In order to better understand biochemical processes inside an individual cell, it is important to measure the molecular composition at the submicron level. One of the promising mass spectrometry imaging techniques that may be used to accomplish this is Time-of-Flight Secondary\udIon Mass Spectrometry (TOF-SIMS), using MeV energy heavy ions for excitation. MeV ions have the ability to desorb large intact molecules with a yield that is several orders of magnitude higher than conventional SIMS using keV ions. In order to increase the spatial resolution of the MeV\udTOF-SIMS system, we propose an independent TOF trigger using a STIM (scanning transmission ion microscopy) detector that is placed just behind the thin transmission target. This arrangement is suitable for biological samples in which the STIM detector simultaneously measures the mass distribution in scanned samples. The capability of the MeV TOF-SIMS setup was demonstrated by imaging the chemical composition of CaCo-2 cells

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