Review of using gallium nitride for ionizing radiation detection
Author(s) -
Jinghui Wang,
Padhraic Mulligan,
L. J. Brillson,
Lei R. Cao
Publication year - 2015
Publication title -
applied physics reviews
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.084
H-Index - 66
ISSN - 1931-9401
DOI - 10.1063/1.4929913
Subject(s) - ionizing radiation , materials science , optoelectronics , neutron , gallium nitride , band gap , radiation , semiconductor , particle detector , radiation hardening , wide bandgap semiconductor , physics , irradiation , optics , nanotechnology , nuclear physics , layer (electronics)
With the largest band gap energy of all commercial semiconductors, GaN has found wide application in the making of optoelectronic devices. It has also been used for photodetection such as solar blind imaging as well as ultraviolet and even X-ray detection. Unsurprisingly, the appreciable advantages of GaN over Si, amorphous silicon (a-Si:H), SiC, amorphous SiC (a-SiC), and GaAs, particularly for its radiation hardness, have drawn prompt attention from the physics, astronomy, and nuclear science and engineering communities alike, where semiconductors have traditionally been used for nuclear particle detection. Several investigations have established the usefulness of GaN for alpha detection, suggesting that when properly doped or coated with neutron sensitive materials, GaN could be turned into a neutron detection device. Work in this area is still early in its development, but GaN-based devices have already been shown to detect alpha particles, ultraviolet light, X-rays, electrons, and neutrons. Furthermo...
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