Optical and electro-optic anisotropy of epitaxial PZT thin films | Zendy

Min Zhu | Zendy; Zehui Du | Zendy; Lin Jing | Zendy; Alfred Iing Yoong Tok | Zendy; Edwin Hang Tong Teo | Zendy

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Optical and electro-optic anisotropy of epitaxial PZT thin films

Author(s) -

Min Zhu,

Zehui Du,

Lin Jing,

Alfred Iing Yoong Tok,

Edwin Hang Tong Teo

Publication year - 2015

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.4927404

Subject(s) - materials science , ferroelectricity , thin film , epitaxy , anisotropy , polarization (electrochemistry) , refractive index , sputter deposition , optoelectronics , optics , sputtering , condensed matter physics , composite material , dielectric , nanotechnology , chemistry , physics , layer (electronics)

Strong optical and electro-optic (EO) anisotropy has been investigated in ferroelectric Pb(Zr0.48Ti0.52)O3 thin films epitaxially grown on Nb-SrTiO3 (001), (011), and (111) substrates using magnetron sputtering. The refractive index, electro-optic, and ferroelectric properties of the samples demonstrate the significant dependence on the growth orientation. The linear electro-optic coefficients of the (001), (011), and (111)-oriented PZT thin films were 270.8, 198.8, and 125.7 pm/V, respectively. Such remarkable anisotropic EO behaviors have been explained according to the structure correlation between the orientation dependent distribution, spontaneous polarization, epitaxial strain, and domain pattern.

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