Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon
Author(s) -
Carsten Schinke,
Christian Peest,
J. Schmidt,
Rolf Brendel,
Karsten Bothe,
M. Vogt,
Ingo Kröger,
S. Winter,
A. Schirmacher,
Siew Yee Lim,
Hieu T. Nguyen,
Daniel Macdonald
Publication year - 2015
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4923379
Subject(s) - attenuation coefficient , materials science , transmittance , absorption (acoustics) , silicon , measurement uncertainty , optics , crystalline silicon , analytical chemistry (journal) , ellipsometry , temperature coefficient , molar absorptivity , wavelength , optoelectronics , thin film , chemistry , physics , nanotechnology , chromatography , quantum mechanics , composite material
Metallic Zn nanodisks with hexagonal morphology were obtained onto glass substrate under vacuum thermal evaporation. A thermal characterization of Zn nanodiks showed a lower oxidation temperature than source powder Zn. Different thermal treatment on Zn nanodisks played an important role on the morphology, crystal size and surface vibrational modes of ZnO. The growth of ZnO nanoneedles started at the edge of metallic zinc hexagonal structures according with SEM images, the higher temperature the longer needles were grown. XRD diffractogram confirmed the wurtzite structure of ZnO with metallic nuclei. A wide band between 530 and 580 cm(-1) of Raman scattering corresponded at surface vibrational modes not observed at higher temperature.Deutsche Bundesstiftung UmweltDF
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