Growing LaAlO3/SrTiO3 interfaces by sputter deposition
Author(s) -
I.M. Dildar,
M. A. Neklyudova,
Qiaoling Xu,
H.W. Zandbergen,
Sybolt Harkema,
D. B. Boltje,
J. Aarts
Publication year - 2015
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4923285
Subject(s) - sputtering , epitaxy , materials science , pulsed laser deposition , thin film , perovskite (structure) , stoichiometry , substrate (aquarium) , sputter deposition , deposition (geology) , optoelectronics , oxygen , oxide , partial pressure , nanotechnology , chemistry , metallurgy , crystallography , layer (electronics) , paleontology , oceanography , organic chemistry , sediment , geology , biology
Sputter deposition of oxide materials in a high-pressure oxygen atmosphere is a well-known technique to produce thin films of perovskite oxides in particular. Also interfaces can be fabricated, which we demonstrated recently by growing LaAlO3 on SrTiO3 substrates and showing that the interface showed the same high degree of epitaxy and atomic order as is made by pulsed laser deposition. However, the high pressure sputtering of oxides is not trivial and number of parameters are needed to be optimized for epitaxial growth. Here we elaborate on the earlier work to show that only a relatively small parameter window exists with respect to oxygen pressure, growth temperature, radiofrequency power supply and target to substrate distance. In particular the sensitivity to oxygen pressure makes it more difficult to vary the oxygen stoichiometry at the interface, yielding it insulating rather than conducting
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