Beam tracking approach for single–shot retrieval of absorption, refraction, and dark–field signals with laboratory x–ray sources
Author(s) -
Fabio A. Vittoria,
Gibril K. Kallon,
Dario Basta,
Paul C. Diémoz,
Ian Robinson,
Alessandro Olivo,
Marco Endrizzi
Publication year - 2015
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4922189
Subject(s) - optics , synchrotron radiation , refraction , physics , tracking (education) , detector , absorption (acoustics) , beam (structure) , dark field microscopy , synchrotron , phase retrieval , phase contrast imaging , resolution (logic) , computer science , artificial intelligence , phase contrast microscopy , psychology , pedagogy , fourier transform , quantum mechanics , microscopy
We present the translation of the beam tracking approach for x–ray phase–contrast and dark–field imaging, recently demonstrated using synchrotron radiation, to a laboratory setup. A single absorbing mask is used before the sample, and a local Gaussian interpolation of the beam at the detector is used to extract absorption, refraction, and dark–field signals from a single exposure of the sample. Multiple exposures can be acquired when high resolution is needed, as shown here. A theoretical analysis of the effect of polychromaticity on the retrieved signals, and of the artifacts this might cause when existing retrieval methods are used, is also discussed.
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