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Research Update: Atmospheric pressure spatial atomic layer deposition of ZnO thin films: Reactors, doping, and devices
Author(s) -
Robert L. Z. Hoye,
David MuñozRojas,
Shelby F. Nelson,
A. Illiberi,
Paul Poodt,
F. Roozeboom,
Judith L. MacManusDriscoll
Publication year - 2015
Publication title -
apl materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.571
H-Index - 60
ISSN - 2166-532X
DOI - 10.1063/1.4916525
Subject(s) - materials science , thin film , atomic layer deposition , dopant , doping , layer (electronics) , perovskite (structure) , optoelectronics , thin film transistor , halide , atmospheric pressure , chemical vapor deposition , deposition (geology) , nanotechnology , chemical engineering , inorganic chemistry , paleontology , chemistry , oceanography , sediment , geology , engineering , biology
Atmospheric pressure spatial atomic layer deposition (AP-SALD) has recently emerged as an appealing technique for rapidly producing high quality oxides. Here, we focus on the use of AP-SALD to deposit functional ZnO thin films, particularly on the reactors used, the film properties, and the dopants that have been studied. We highlight how these films are advantageous for the performance of solar cells, organometal halide perovskite light emitting diodes, and thin-film transistors. Future AP-SALD technology will enable the commercial processing of thin films over large areas on a sheet-to-sheet and roll-to-roll basis, with new reactor designs emerging for flexible plastic and paper electronics.

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