Open AccessDirect probing of electron and hole trapping into nano-floating-gate in organic field-effect transistor nonvolatile memories
Author(s) -
Zequn Cui,
Shun Wang,
Jianmei Chen,
Xu Gao,
Bin Dong,
Lifeng Chi,
SuiDong Wang
Publication year - 2015
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4916511
Subject(s) - pentacene , trapping , transistor , electron , materials science , optoelectronics , field effect transistor , kelvin probe force microscope , non volatile memory , nanotechnology , chemistry , thin film transistor , physics , voltage , atomic force microscopy , ecology , layer (electronics) , quantum mechanics , biology
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom