Lattice parameters and Raman-active phonon modes of β-(AlxGa1−x)2O3
Author(s) -
C. Kranert,
Marcus Jenderka,
J. Lenzner,
Michael Lorenz,
Holger von Wenckstern,
Rüdiger SchmidtGrund,
Marius Grundmann
Publication year - 2015
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4915627
Subject(s) - raman spectroscopy , phonon , thin film , materials science , diffraction , lattice (music) , lattice constant , condensed matter physics , pulsed laser deposition , ceramic , crystal structure , analytical chemistry (journal) , chemistry , crystallography , optics , nanotechnology , physics , chromatography , acoustics , composite material
We present X-ray diffraction and Raman spectroscopy investigations of a (100)-oriented (AlxGa1–x)2O3 thin film on MgO (100) and bulk-like ceramics in dependence on their composition. The thin film grown by pulsed laser deposition has a continuous lateral composition spread allowing to determine precisely the dependence of the phonon mode properties and lattice parameters on the chemical composition. For x < 0.4, we observe the single-phase β-modification. Its lattice parameters and phonon energies depend linearly on the composition. We determined the slopes of these dependencies for the individual lattice parameters and for nine Raman lines, respectively. While the lattice parameters of the ceramics follow Vegard's rule, deviations are observed for the thin film. This deviation has only a small effect on the phonon energies, which show a reasonably good agreement between thin film and ceramics.
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