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Experimental evidence of Xe incorporation in Schottky defects in UO2
Author(s) -
René Bès,
P. Martín,
Emerson Vathonne,
Rémy Delorme,
C. Sabathier,
Michel Freyss,
Marjorie Bertolus,
Pieter Glatzel
Publication year - 2015
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4914300
Subject(s) - xenon , uranium dioxide , annealing (glass) , uranium oxide , uranium , schottky diode , materials science , noble gas , oxide , xanes , absorption (acoustics) , actinide , radiochemistry , chemistry , atomic physics , optoelectronics , inorganic chemistry , physics , diode , quantum mechanics , spectroscopy , metallurgy , composite material
We report here the direct experimental observation of the preferential xenon incorporation site in uranium dioxide and analyse how its incorporation evolves with the annealing temperature. We show that High Energy Resolution Fluorescence Detection X-ray Absorption Near Edge Structure in combination with first-principles calculations enable a precise determination of the Xe incorporation site. Our finding provides important insight for the understanding and modeling of noble gases behavior in nuclear oxide fuel.

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