The role of the hole-extraction layer in determining the operational stability of a polycarbazole:fullerene bulk-heterojunction photovoltaic device
Author(s) -
Edward Bovill,
Nicholas W. Scarratt,
Jon Griffin,
Yi Huang,
Ahmed Iraqi,
Alastair Buckley,
James Kingsley,
David G. Lidzey
Publication year - 2015
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4909530
Subject(s) - pedot:pss , fullerene , materials science , photovoltaic system , heterojunction , organic solar cell , optoelectronics , polymer solar cell , layer (electronics) , polymer , active layer , nanotechnology , energy conversion efficiency , composite material , chemistry , organic chemistry , electrical engineering , thin film transistor , engineering
We have made a comparative study of the relative operational stability of bulk-heterojunction organic photovoltaic (OPV) devices utilising different hole transport layers (HTLs). OPV devices were fabricated based on a blend of the polymer PCDTBT with the fullerene PC70BM, and incorporated the different HTL materials PEDOT:PSS, MoOx and V2O5. Following 620 h of irradiation by light from a solar simulator, we find that devices using the PEDOT:PSS HTL retained the highest efficiency, having a projected T80 lifetime of 14 500 h.
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