Open AccessElectron microscopy study of Ni induced crystallization in amorphous Si thin films
Author(s) -
G. Radnóczi,
Erzsébet Dódony,
G. Battistig,
Ν. Vouroutzis,
J. Stoëmenos,
N. Frangis,
András Kovács,
B. Pécz
Publication year - 2015
Publication title -
aip conference proceedings
Language(s) - Uncategorized
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4908579
Subject(s) - crystallization , materials science , transmission electron microscopy , annealing (glass) , amorphous silicon , silicon , amorphous solid , nanocrystalline silicon , chemical engineering , crystallography , analytical chemistry (journal) , crystalline silicon , nanotechnology , optoelectronics , metallurgy , chemistry , chromatography , engineering
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