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Principles of femtosecond X-ray/optical cross-correlation with X-ray induced transient optical reflectivity in solids
Author(s) -
Sebastian Eckert,
Martin Beye,
Annette Pietzsch,
Wilson Quevedo,
Markus Hantschmann,
Miguel Ochmann,
Matthew R. Ross,
Michael P. Minitti,
James J. Turner,
Stefan Moeller,
W. F. Schlotter,
Georgi L. Dakovski,
Munira Khalil,
Nils Huse,
Alexander Föhlisch
Publication year - 2015
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4907949
Subject(s) - femtosecond , ultrashort pulse , optics , x ray optics , refractive index , relaxation (psychology) , x ray , cross correlation , laser , materials science , transient (computer programming) , excitation , optoelectronics , physics , mathematical analysis , mathematics , computer science , operating system , psychology , social psychology , quantum mechanics
The discovery of ultrafast X-ray induced optical reflectivity changes enabled the development of X-ray/optical cross correlation techniques at X-ray free electron lasers worldwide. We have now linked through experiment and theory the fundamental excitation and relaxation steps with the transient optical properties in finite solid samples. Therefore, we gain a thorough interpretation and an optimized detection scheme of X-ray induced changes to the refractive index and the X-ray/optical cross correlation response

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