Influence of Bi on embedded nanocrystal formation and thermoelectric properties of GaAs
Author(s) -
Michael V. Warren,
J. C. Canniff,
Hang Chi,
Fabián Naab,
Vladimir A. Stoica,
Roy Clarke,
Ctirad Uher,
R. S. Goldman
Publication year - 2015
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4906992
Subject(s) - thermoelectric effect , materials science , nanocrystal , microstructure , annealing (glass) , thermal conductivity , figure of merit , thermoelectric materials , nanocomposite , electrical resistivity and conductivity , superlattice , optoelectronics , nanotechnology , composite material , electrical engineering , thermodynamics , physics , engineering
We have examined the influence of Bi on embedded nanocomposite formation and the resulting thermoelectric properties of GaAs. Bi implantation amorphizes the GaAs matrix, reducing both the free carrier concentration (n) and the electrical conductivity (σ). Following rapid thermal annealing, the matrix is transformed to single crystal GaAs with embedded Bi nanocrystals (NCs). In comparison to a GaAs reference, the Bi NC-containing films exhibit a sizeable reduction in thermal conductivity (κ), leading to a 30% increase in the thermoelectric figure-of-merit. We also present a universal trend for the influence of microstructure on the n-dependence of σ and κ.
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