
The effects of tungsten concentration on crystalline structure and perpendicular magnetic anisotropy of Co-W films
Author(s) -
Shengyong Yin,
Yong Wu,
Xianglan Xu,
H. Wang,
J.P. Wang,
Yong Jiang
Publication year - 2014
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4905447
Subject(s) - thin film , materials science , coercivity , magnetocrystalline anisotropy , tungsten , amorphous solid , sputter deposition , condensed matter physics , magnetic anisotropy , annealing (glass) , sputtering , crystallography , composite material , magnetization , metallurgy , magnetic field , chemistry , nanotechnology , physics , quantum mechanics
In this study, Co-W thin films deposited by DC magnetron sputtering were demonstrated to be perpendicular magnetic anisotropic with large magnetocrystalline anisotropy energy (MAE). Thermodynamic calculations based on Miedema’s semi-empirical model have been used to estimate the phase in this binary alloy system. Based on the thermodynamic calculations results, a series of Co-W thin films were deposited on amorphous Ta underlayer with different tungsten concentrations. According to the X-ray diffraction results, the crystal structure of Co-W thin films is consistent well with that of thermodynamic calculations. Large MAE of Co-W thin films can be obtained with Ku over 2.1 × 105 J/m3 after vacuum annealing. The perpendicular coercivity (Hc) of Co-W thin film reaches 9.1 × 104 A/m. Therefore, the Co-W thin film is considered as a potential choice of high-density magnetic recording media materials