Open AccessDielectric relaxation analysis of Pb(Zr0.54,Ti0.46)O3 thin films: Electric field dependence
Author(s) -
Freddy Ponchel,
Nossikpendou Sama,
Denis Rémiens,
T. Lasri
Publication year - 2014
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4904514
Subject(s) - materials science , electric field , crystallite , relaxation (psychology) , permittivity , microstructure , dielectric , thin film , diffraction , layer (electronics) , condensed matter physics , composite material , analytical chemistry (journal) , optoelectronics , optics , nanotechnology , chemistry , metallurgy , psychology , social psychology , quantum mechanics , physics , chromatography
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