Characterization of surface modification in atomic force microscope-induced nanolithography of oxygen deficient La0.67Ba0.33MnO3−δ thin films
Author(s) -
E. K. Tanyi,
Rajeswari Kolagani,
Parul Srivastava,
William E. Vanderlinde,
Grace Yong,
Christopher Stumpf,
David Schaefer
Publication year - 2014
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4904427
Subject(s) - materials science , barium , kelvin probe force microscope , thin film , lanthanum , oxygen , stoichiometry , analytical chemistry (journal) , surface modification , scanning electron microscope , nanolithography , atomic force microscopy , barium oxide , nanotechnology , oxide , chemical engineering , inorganic chemistry , chemistry , composite material , fabrication , metallurgy , engineering , medicine , alternative medicine , organic chemistry , chromatography , pathology
We report our studies of the nanolithographic surface modifications induced by an Atomic Force Microscope (AFM) in epitaxial thin films of oxygen deficient Lanthanum Barium Manganese Oxide (La0.67Ba0.33MnO3−δ). The pattern characteristics depend on the tip voltage, tip polarity, voltage duration, tip force, and humidity. We have used Electron Energy Dispersive X-Ray Spectroscopy (EDS) to analyze the chemical changes associated with the surface modifications produced with a negatively biased AFM tip. A significant increase in the oxygen stoichiometry for the patterned regions relative to the pristine film surface is observed. The results also indicate changes in the cation stoichiometry, specifically a decrease in the Lanthanum and Manganese concentrations and an increase in the Barium concentration in the patterned regions
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom