Low temperature photoresponse of monolayer tungsten disulphide
Author(s) -
Bingchen Cao,
Xiaonan Shen,
Jingzhi Shang,
Chunxiao Cong,
Weihuang Yang,
Mustafa Eginligil,
Ting Yu
Publication year - 2014
Publication title -
apl materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.571
H-Index - 60
ISSN - 2166-532X
DOI - 10.1063/1.4900816
Subject(s) - monolayer , materials science , chemical vapor deposition , tungsten disulfide , tungsten , tungsten diselenide , exfoliation joint , optoelectronics , transition metal , trapping , deposition (geology) , photochemistry , nanotechnology , graphene , composite material , metallurgy , chemistry , catalysis , organic chemistry , ecology , paleontology , sediment , biology
High photoresponse can be achieved in monolayers of transition metal dichalcogenides. However, the response times are inconveniently limited by defects. Here, we report low temperature photoresponse of monolayer tungsten disulphide prepared by exfoliation and chemical vapour deposition (CVD) method. The exfoliated device exhibits n-type behaviour; while the CVD device exhibits intrinsic behaviour. In off state, the CVD device has four times larger ratio of photoresponse for laser on/off and photoresponse decay–rise times are 0.1 s (limited by our setup), while the exfoliated device has few seconds. These findings are discussed in terms of charge trapping and localization
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