Comment on “Evaluation of the spatial distribution of series and shunt resistance of a solar cell using dark lock-in thermography” [J. Appl. Phys. 115, 034901 (2014)] | Zendy

O. Breitenstein | Zendy; Sven Rißland | Zendy

Open Access

Comment on “Evaluation of the spatial distribution of series and shunt resistance of a solar cell using dark lock-in thermography” [J. Appl. Phys. 115, 034901 (2014)]

Author(s) -

O. Breitenstein,

Sven Rißland

Publication year - 2014

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.4891522

Subject(s) - equivalent series resistance , thermography , series (stratigraphy) , work (physics) , physics , shunt (medical) , measure (data warehouse) , optics , thermodynamics , quantum mechanics , computer science , voltage , infrared , geology , cardiology , database , medicine , paleontology

In a recent article, Chung et al. [J. Appl. Phys. 115, 034901 (2014)] proposed a novel method to measure series resistances in solar cells quantitatively by dark lock-in thermography. However, the theory to this method contains a mathematical fault; therefore, the method cannot work as expected. Some unphysical predictions and consequences of this theory are reported.

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