Direct synthesis of highly textured Ge on flexible polyimide films by metal-induced crystallization
Author(s) -
Oya N,
Kaoru Toko,
Noriyuki Saitoh,
Noriko Yoshizawa,
Takashi Suemasu
Publication year - 2014
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4887236
Subject(s) - polyimide , materials science , crystallization , crystallite , amorphous solid , grain size , layer (electronics) , germanium , thin film , optoelectronics , crystal (programming language) , composite material , crystallography , nanotechnology , metallurgy , chemical engineering , silicon , chemistry , computer science , engineering , programming language
The highly (111)-textured Ge thin film (50-nm thickness) is demonstrated on a flexible polyimide film via the low-temperature crystallization (325 °C) of amorphous Ge using Al as a catalyst. Covering the polyimide with insulators significantly improved the crystal quality of the resulting Ge layer. In particular, SiN covering led to 97% (111)-oriented Ge with grains 200 μm in size, two orders larger than the grain size of polycrystalline Ge directly formed on the polyimide film. This achievement will give a way to realize advanced electronic and optical devices simultaneously allowing for high performance, inexpensiveness, and flexibility
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