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On the electronic properties of a single dislocation
Author(s) -
Manfred Reiche,
M. Kittler,
Wilfried Erfurth,
Eckhard Pippel,
Kornelia Sklarek,
H. Blumtritt,
Angelika Haehnel,
Hartmut Uebensee
Publication year - 2014
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4876265
Subject(s) - dislocation , materials science , silicon , condensed matter physics , electrical resistivity and conductivity , core (optical fiber) , single crystal , partial dislocations , nanowire , electrical conductor , dislocation creep , electronic structure , crystallography , optoelectronics , composite material , chemistry , electrical engineering , physics , engineering

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