Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution
Author(s) -
M. Kozina,
Te Hu,
Joshua S. Wittenberg,
Erzsi Szilagyi,
Mariano Trigo,
T. Miller,
Ctirad Uher,
Anoop R. Damodaran,
Lane W. Martin,
Apurva Mehta,
Jeff Corbett,
J. Safranek,
David A. Reis,
Aaron M. Lindenberg
Publication year - 2014
Publication title -
structural dynamics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.415
H-Index - 29
ISSN - 2329-7778
DOI - 10.1063/1.4875347
Subject(s) - picosecond , diffraction , materials science , thin film , synchrotron , resolution (logic) , brightness , scattering , excited state , lattice (music) , optics , molecular physics , atomic physics , chemistry , laser , physics , nanotechnology , artificial intelligence , computer science , acoustics
We report measurements of the transient structural response of weakly photo-excited thin films ofBiFeO3, Pb(Zr,Ti)O3, and Bi and time-scales for interfacialthermal transport. Utilizing picosecond x-ray diffraction at a 1.28 MHz repetition rate with timeresolution extending down to 15 ps, transient changes in the diffraction angle are recorded.These changes are associated with photo-induced lattice strains within nanolayerthin films,resolved at the part-per-million level, corresponding to a shift in the scattering angle three ordersof magnitude smaller than the rocking curve width and changes in the interlayer latticespacing of fractions of a femtometer. The combination of high brightness, repetition rate,and stability of the synchrotron, in conjunction with high time resolution, represents anovel means to probe atomic-scale, near-equilibrium dynamics
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom