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We report measurements of the transient structural response of weakly photo-excited thin films ofBiFeO3, Pb(Zr,Ti)O3, and Bi and time-scales for interfacialthermal transport. Utilizing picosecond x-ray diffraction at a 1.28 MHz repetition rate with timeresolution extending down to 15 ps, transient changes in the diffraction angle are recorded.These changes are associated with photo-induced lattice strains within nanolayerthin films,resolved at the part-per-million level, corresponding to a shift in the scattering angle three ordersof magnitude smaller than the rocking curve width and changes in the interlayer latticespacing of fractions of a femtometer. The combination of high brightness, repetition rate,and stability of the synchrotron, in conjunction with high time resolution, represents anovel means to probe atomic-scale, near-equilibrium dynamics

Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution