Phase transformation of ZnMoO4 by localized thermal spike
Author(s) -
D.C. Agarwal,
D.K. Avasthi,
Shikha Varma,
Felipe Kremer,
M.C. Ridgway,
D. Kabiraj
Publication year - 2014
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4872259
Subject(s) - x ray photoelectron spectroscopy , fluence , materials science , analytical chemistry (journal) , crystallite , raman spectroscopy , irradiation , annealing (glass) , ion beam , transmission electron microscopy , ion , chemistry , optics , nuclear magnetic resonance , nanotechnology , physics , organic chemistry , chromatography , nuclear physics , metallurgy , composite material
We show that ZnMoO4 remains in stable phase under thermal annealing up to 1000 °C, whereas it decomposes to ZnO and MoO3 under transient thermal spike induced by 100 MeV Ag irradiation. The transformation is evidenced by X-ray diffraction (XRD), Raman spectroscopy, and X-ray photoelectron spectroscopy (XPS). Thin films of ZnMoO4 were synthesized by thermal evaporation and subsequent annealing in oxygen ambient at 600 °C for 4 h. XRD results show that as the irradiation fluence increases, the peak related to ZnMoO4 decreases gradually and eventually disappear, whereas peaks related to ZnO grow steadily up to fluence of 3 × 1012 ions/cm2 and thereafter remain stable till highest fluence. This indicates that polycrystalline ZnMoO4 film has transformed to polycrystalline ZnO thin film. The Raman lines related to ZnMoO4 are observed to have disappeared with increasing irradiation fluence. XPS results show modification in bonding and depletion of Mo from near surface region after the ion irradiation. Cross-sect...
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