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Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths
Author(s) -
Carsten Schinke,
Karsten Bothe,
Peter Christian Peest,
Jan Schmidt,
Rolf Brendel
Publication year - 2014
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4866916
Subject(s) - icon , citation , information retrieval , silicon , computer science , online search , absorption (acoustics) , world wide web , physics , optics , optoelectronics , programming language
We present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range from 950 to 1350 nm and analyze its uncertainty. The data is obtained from measurements of reflectance and transmittance as well as spectrally resolved photoluminescence measurements and spectral response measurements. A rigorous measurement uncertainty analysis based on an extensive characterization of our setups is carried out. We determine relative uncertainties of 4% at 1000 nm, increasing to 22% at 1200 nm and 160% at 1300 nm, and show that all methods yield comparable results. © 2014 AIP Publishing LLC

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