z-logo
open-access-imgOpen Access
Influence of the doping on the lattice sites of Fe in Si
Author(s) -
D.J. Silva,
U. Wahl,
J. G. Correia,
João P. Araújo
Publication year - 2014
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4865597
Subject(s) - doping , silicon , materials science , vacancy defect , lattice (music) , crystallography , thermal stability , tetrahedron , getter , chemical physics , condensed matter physics , chemistry , metallurgy , optoelectronics , physics , organic chemistry , acoustics
We report on the lattice location and thermal stability of Fe in n+- and p+-type silicon. By means of emission channeling we have observed Fe on ideal substitutional sites, sites located in between bond-centered (BC) and substitutional sites, and sites displaced from tetrahedral towards anti-bonding sites. Here, we focus our analysis on the identification of Fe displaced 0.4-0.6 A from BC sites and the influence of the doping on the stability of these sites. Fe on near-BC sites is found to be more thermally stable in n+-type Si than in low doped or p+-type Si, and seems to be related to multiple vacancy defects. We suggest that the complexes which trap Fe near BC sites, as well as the formation of substitutional Fe, may play a crucial role in P-diffusion gettering.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom