z-logo
open-access-imgOpen Access
Heteroepitaxy of InP on Si(001) by selective-area metal organic vapor-phase epitaxy in sub-50 nm width trenches: The role of the nucleation layer and the recess engineering
Author(s) -
Clément Merckling,
Niamh Waldron,
Shidong Jiang,
Weiming Guo,
N. Collaert,
M. Caymax,
E. Vancoille,
K. Barla,
Aaron Thean,
M. Heyns,
Wilfried Vandervorst
Publication year - 2014
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4862044
Subject(s) - nucleation , materials science , trench , epitaxy , silicon , layer (electronics) , shallow trench isolation , optoelectronics , semiconductor , chemical vapor deposition , metalorganic vapour phase epitaxy , phase (matter) , nanotechnology , chemistry , organic chemistry

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom