z-logo
open-access-imgOpen Access
Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films
Author(s) -
Anna Behler,
Niclas Teichert,
Biswanath Dutta,
Anja Waske,
Tilmann Hickel,
A. Auge,
Andreas Hütten,
J. Eckert
Publication year - 2013
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4849795
Subject(s) - antiferromagnetism , exchange bias , condensed matter physics , ferromagnetism , materials science , diffusionless transformation , martensite , epitaxy , thin film , ab initio quantum chemistry methods , phase (matter) , metallurgy , chemistry , microstructure , layer (electronics) , nanotechnology , magnetization , magnetic anisotropy , physics , organic chemistry , quantum mechanics , molecule , magnetic field

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom